Electronic testing in IC fabrication cycle; the importance and organisation of testing within technological process; test equipment used in industry to verify the correct operation of digital integrated circuits (generic architecture and operation of a test system, main modules of a tester and their operation, computer-aided test engineering tools, test system programming, device interface board design), digital test methodologies (DC parametric, AC, functional and IDDQ tests), semiconductor memory testing, introduction to analog and mixed-signal testing, design-for-testability and built-in self-test and their implication on test technology, test data collection and analysis. -- Course Website
Instructor: Dr Melanie Ooi (Sunway)
Prerequisites: ECE2061 and ECE2072
